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Conference Paper

Measuring Systematic and Random Error in Digital Forensics [abstract]

Published: July 24, 2015

Author(s)

Alexander Nelson, Simson Garfinkel

Conference

Name: International Symposium on Forensic Science Error Management: Detection, Measurement and Mitigation
Dates: July 21-24, 2015
Location: Arlington, Virginia, United States

Announcement

Abstract

Keywords

ascription; attribution; digital storage forensics; error rate; systematic error measurement; verification
Control Families

None selected

Documentation

Publication:
None available

Supplemental Material:
None available

Document History:
07/24/15: Conference Paper (Final)